Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography
Crossref DOI link: https://doi.org/10.1007/s11664-017-5789-x
Published Online: 2017-09-20
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guo, Jianqiu http://orcid.org/0000-0002-5727-6767
Yang, Yu
Raghothamachar, Balaji
Dudley, Michael
Stoupin, Stanislav
License valid from 2017-09-20