LabVIEW-based control and acquisition system for the dosimetric characterization of a silicon strip detector
Crossref DOI link: https://doi.org/10.1063/1.4974817
Published Online: 2017-02-02
Published Print: 2017-02-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Ovejero, M. C.
Pérez Vega-Leal, A.
Gallardo, M. I.
Espino, J. M. http://orcid.org/0000-0003-4848-5847
Selva, A.
Cortés-Giraldo, M. A.
Arráns, R.