Atomic-resolution analytical scanning transmission electron microscopy of topological insulators with a layered tetradymite structure
Crossref DOI link: https://doi.org/10.1063/5.0014113
Published Online: 2020-07-10
Published Print: 2020-07-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Reifsnyder Hickey, Danielle http://orcid.org/0000-0002-8962-1473
Mkhoyan, K. Andre http://orcid.org/0000-0003-3568-5452
Funding for this research was provided by:
Semiconductor Research Corporation (SMART Center, nCORE)