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Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Published Online: 2009-01-24

Published Print: 2009-04-01

Authors

Cayron, Cyril

Den Hertog, Martien

Latu-Romain, Laurence

Mouchet, Céline

Secouard, Christopher

Rouviere, Jean-Luc

Rouviere, Emmanuelle

Simonato, Jean-Pierre
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Version of Record valid from 2009-01-24

Text and Data Mining valid from 2009-01-24
More Information

Journal: Journal of Applied Crystallography

Content type: research papers

Peer review

Peer reviewed: Yes

Review process: Single blind

Publication history

Received: 31 July 2008

Accepted: 10 December 2008

Published online: 24 January 2009

Copyright and licencing

Copyright: © 2009 Cyril Cayronet al.

Licence: Creative Commons Attribution (CC-BY)

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