Local ultra-violet surface photovoltage spectroscopy of single thread dislocations in gallium nitrides by Kelvin probe force microscopy
Crossref DOI link: https://doi.org/10.1063/1.4772538
Published Online: 2012-12-19
Published Print: 2012-12-17
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Liu, Zhenghui
Xu, Ke
Fan, Yingmin
Xu, Gengzhao
Huang, Zengli
Zhong, Haijian
Wang, Jianfeng
Yang, Hui
Funding for this research was provided by:
Chinese Academy of Sciences (YG2011071, YZ200939)
National Natural Science Foundation of China (10904107)
