Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0.53Ga0.47As capacitors
Crossref DOI link: https://doi.org/10.1116/1.4774109
Published Online: 2013-01-09
Published Print: 2013-01-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Monaghan, Scott
O'Connor, Éamon
Povey, Ian M.
Sheehan, Brendan J.
Cherkaoui, Karim
Hutchinson, Barry J. A.
Hurley, Paul K.
Ferdousi, Fahmida
Rios, Rafael
Kuhn, Kelin J.
Rahman, Anisur
