Accurate determination of interface trap state parameters by admittance spectroscopy in the presence of a Schottky barrier contact: Application to ZnO-based solar cells
Crossref DOI link: https://doi.org/10.1063/1.4799633
Published Online: 2013-04-09
Published Print: 2013-04-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Marin, Andrew T.
Musselman, Kevin P.
MacManus-Driscoll, Judith L.
