Transmission electron microscopy study of degradation in transparent indium tin oxide/Ag/indium tin oxide multilayer films
Crossref DOI link: https://doi.org/10.1063/1.4812815
Published Online: 2013-07-02
Published Print: 2013-07-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Jeong, Jin-A
Kim, Han-Ki
Koo, Hyun-Woo
Kim, Tae-Woong
