Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy
Crossref DOI link: https://doi.org/10.1063/1.4816752
Published Online: 2013-07-25
Published Print: 2013-07-22
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Kong, X. H.
Ji, H. X.
Piner, R. D.
Li, H. F.
Magnuson, C. W.
Tan, C.
Ismach, A.
Chou, H.
Ruoff, R. S.
