Effects of crystallization mechanism on the electrical characteristics of green continuous-wave-laser-crystallized polycrystalline silicon thin film transistors
Crossref DOI link: https://doi.org/10.1063/1.4812669
Published Online: 2013-08-02
Published Print: 2013-07-29
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Chou, Chia-Hsin
Lee, I-Che
Yang, Po-Yu
Hu, Ming-Jhe
Wang, Chao-Lung
Wu, Chun-Yu
Chien, Yun-Shan
Wang, Kuang-Yu
Cheng, Huang-Chung
