Femtosecond photoelectron point projection microscope
Crossref DOI link: https://doi.org/10.1063/1.4827035
Published Online: 2013-10-30
Published Print: 2013-10-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Quinonez, Erik
Handali, Jonathan
Barwick, Brett
