Reproducible nanostructure fabrication using atomic force microscopy indentation with minimal tip damage
Crossref DOI link: https://doi.org/10.1116/1.4862538
Published Print: 2014-03
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Jeon, SeungHee
Ryu, BongWoo
Jhe, Wonho
Khim, Zheong G.
Kim, Byung I.