Reactive ZnO/Ti/ZnO interfaces studied by hard x-ray photoelectron spectroscopy
Crossref DOI link: https://doi.org/10.1063/1.4854636
Published Online: 2014-01-28
Published Print: 2014-01-28
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Knut, Ronny
Lindblad, Rebecka
Grachev, Sergey
Faou, Jean-Yvon
Gorgoi, Mihaela
Rensmo, Håkan
Søndergård, Elin
Karis, Olof
