Improved image quality in pinhole SPECT by accurate modeling of the point spread function in low magnification systems
Crossref DOI link: https://doi.org/10.1118/1.4905157
Published Online: 2015-01-14
Published Print: 2015-02
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Pino, Francisco
Roé, Nuria
Aguiar, Pablo
Falcon, Carles
Ros, Domènec
Pavía, Javier
Version of Record valid from 2015-01-14
Text and Data Mining valid from 2015-09-01
