Scanning capacitance microscopy using a relaxation oscillator
Crossref DOI link: https://doi.org/10.1119/1.4899045
Published Print: 2015-02-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Pahlmeyer, M.
Hankins, A.
Tuppan, S.
Kim, W. J.
