Disorder-free localization around the conduction band edge of crossing and kinked silicon nanowires
Crossref DOI link: https://doi.org/10.1063/1.4907585
Published Online: 2015-02-09
Published Print: 2015-02-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Keleş, Ümit
Çakan, Aslı
Bulutay, Ceyhun
Funding for this research was provided by:
Türkiye Bilimsel ve Teknolojik Arastirma Kurumu (109R037)
