Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces
Crossref DOI link: https://doi.org/10.1116/1.4915898
Published Online: 2015-03-20
Published Print: 2015-05-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Uluutku, Berkin
Baykara, Mehmet Z.
