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High-resolution characterization of the forbidden Si 200 and Si 222 reflections

Published Online: 2015-03-24

Published Print: 2015-04-01

Authors

Zaumseil, Peter
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Version of Record valid from 2015-03-24

Text and Data Mining valid from 2015-03-24
More Information

Publication: Journal of Applied Crystallography

Content type: research papers

Peer review

Peer reviewed: Yes

Review process: Single blind

Publication history

Received: 13 November 2014

Accepted: 7 March 2015

Published online: 24 March 2015

Copyright and licencing

Copyright: © 2015 Peter Zaumseil

Licence: Creative Commons Attribution (CC-BY)

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