X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices
Crossref DOI link: https://doi.org/10.1116/1.4954401
Published Online: 2016-06-22
Published Print: 2016-07-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Aydogan, Pinar
Polat, Emre O.
Kocabas, Coskun
Suzer, Sefik
Funding for this research was provided by:
n/a
