Arutt, Charles N
Alles, Michael L
Liao, Wenjun
Gong, Huiqi
Davidson, Jim L
Schrimpf, Ronald D
Reed, Robert A
Weller, Robert A
Bolotin, Kirill
Nicholl, Ryan
Pham, Thang Toan
Zettl, Alex
Qingyang, Du
Hu, Juejun
Li, Mo
Alphenaar, Bruce W
Lin, Ji-Tzuoh
Shurva, Pranoy Deb
McNamara, Shamus
Walsh, Kevin M
Feng, Philip X-L
Hutin, Louis
Ernst, Thomas
Homeijer, Brian D
Polcawich, Ronald G
Proie, Robert M
Jones, Jacob L
Glaser, Evan R
Cress, Cory D
Bassiri-Gharb, Nazanin
Funding for this research was provided by:
Defense Threat Reduction Agency (HDTRA1-15-1-0027)
Defense Threat Reduction Agency (HDTRA1-15-1-0060)
Defense Threat Reduction Agency (HDTRA1-15-1-0039)
Defense Threat Reduction Agency (HDTRA1-15-1-0036)
Defense Threat Reduction Agency (HDTRA1-15-1-0035)
Journal title: Semiconductor Science and Technology
Article type: rev
Article title: The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)
Copyright information: © 2016 IOP Publishing Ltd
Publication dates
Date received: 2016-06-30
Date accepted: 2016-10-17
Online publication date: 2016-12-09