Plasmonic properties of implanted Ag nanoparticles in SiO2 thin layer by spectroscopic ellipsometry
Crossref DOI link: https://doi.org/10.1063/1.4989793
Published Online: 2017-08-28
Published Print: 2017-08-28
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Battie, Yann
En Naciri, Aotmane
Chaoui, Nouari
Le Gall, Yann
Muller, Dominique https://orcid.org/0000-0003-2656-4894
Carrada, Marzia https://orcid.org/0000-0001-8828-6805
Mathiot, Daniel https://orcid.org/0000-0003-2845-3776
