Crossmark

Impact of radiation induced crystallization on programmable metallization cell electrical characteristics and reliability

Crossref DOI link: https://doi.org/10.1039/C8FD00125A

Published Online: 2019

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Gonzalez-Velo, Yago https://orcid.org/0000-0003-0113-0408
Patadia, Arshey https://orcid.org/0000-0002-1726-0736
Barnaby, Hugh J.

Kozicki, Michael N. https://orcid.org/0000-0003-1281-6827
Funding

Funding for this research was provided by:

Defense Threat Reduction Agency (HDTRA1-11-21-BRCWMD-BAA)

Air Force Research Laboratory (FA9453-15-0080)

Arizona Board of Regents (RIF fund)

National Science Foundation (ECCS-1542160)
License Information

Accepted Manuscript valid from 2019-11-12
More Information

SIMILARITY CHECK

: This document is Similarity Check deposited

ASSOCIATED ARTICLES

CrossRef DOI Link to Discussion:: https://doi.org/10.1039/C8FD90059K

IDENTIFIERS

: Yago Gonzalez-Velo (ORCID)

: Yago Gonzalez-Velo (ResearcherID)

: Arshey Patadia (ORCID)

: Arshey Patadia (ResearcherID)

: Michael N. Kozicki (ORCID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 18 June 2018; Accepted 3 August 2018; Advance Article published 12 November 2018; Version of Record published 18 February 2019