Crossmark

Effects of the AlN nucleation layer thickness on the crystal structures of an AlN epilayer grown on the 6H-SiC substrate

Crossref DOI link: https://doi.org/10.1080/14786435.2019.1600757

Published Online: 2019-04-08

Published Print: 2019-07-18

Update policy: https://doi.org/10.1080/tandf_crossmark_01

Authors

Arslan, Engin

Öztürk, Mustafa K.

Özçelik, Süleyman

Özbay, Ekmel
Funding

Funding for this research was provided by:

TUBITAK

Turkish Academy of Sciences
More Information

Peer Review Statement: The publishing and review policy for this title is described in its Aims & Scope.

Aim & Scope: http://www.tandfonline.com/action/journalInformation?show=aimsScope&journalCode=tphm20

Publication History

Received: 2018-11-12

Accepted: 2019-03-06

Published: 2019-04-08