Structural origins of electronic conduction in amorphous copper-doped alumina
Crossref DOI link: https://doi.org/10.1103/PhysRevMaterials.3.065605
Published Online: 2019-06-28
Update policy: https://doi.org/10.1103/crossmark-policy
Subedi, K. N.
Prasai, K.
Kozicki, M. N.
Drabold, D. A. https://orcid.org/0000-0001-5344-5837
Funding for this research was provided by:
National Science Foundation (DMR 1507670, DMR 1506836, ACI-1548562)
Version of Record valid from 2019-06-28
Accepted Manuscript valid from 2020-06-27
