Mackenzie, David M A http://orcid.org/0000-0003-1114-2955
Kalhauge, Kristoffer G http://orcid.org/0000-0002-9896-6289
Whelan, Patrick R http://orcid.org/0000-0002-3978-7029
Østergaard, Frederik W
Pasternak, Iwona
Strupinski, Wlodek
Bøggild, Peter http://orcid.org/0000-0002-4342-0449
Jepsen, Peter U
Petersen, Dirch H http://orcid.org/0000-0002-9309-4186
Funding for this research was provided by:
Danmarks Grundforskningsfond (DNRF103 CNG)
Horizon 2020 Framework Programme (692527)
Article Title: Wafer-scale graphene quality assessment using micro four-point probe mapping
Journal Title: Nanotechnology
Article Type: paper
Copyright Information: © 2020 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2019-10-11
Date Accepted: 2020-02-14
Online publication date: 2020-03-13