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Oxidation as Key Mechanism for Efficient Interface Passivation in <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>Cu</mml:mi><mml:mo stretchy="false">(</mml:mo><mml:mi>In</mml:mi><mml:mo>,</mml:mo><mml:mi>Ga</mml:mi><mml:mo stretchy="false">)</mml:mo><mml:msub><mml:mi>Se</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:math> Thin-Film Solar Cells

Crossref DOI link: https://doi.org/10.1103/PhysRevApplied.13.054004

Published Online: 2020-05-04

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