Failure-oriented-accelerated-testing (FOAT) and its role in assuring electronics reliability: review
Crossref DOI link: https://doi.org/10.29328/journal.ijpra.1001048
Published Online: 2023-01-06
Published Print: 2023-01-06
Update policy: https://doi.org/10.29328/crossmark-policy
E, Suhir