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Extended topological line defects in graphene for individual identification of DNA nucleobases

Published Online: 2020

Authors

Kumawat, Rameshwar L. https://orcid.org/0000-0002-2210-3428
Pathak, Biswarup https://orcid.org/0000-0002-9972-9947
License Information

Version of Record valid from 2020-10-14
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SIMILARITY CHECK

: This document is Similarity Check deposited

RELATED DATA

: Supplementary Information

IDENTIFIERS

: Rameshwar L. Kumawat (ORCID)

: Biswarup Pathak (ORCID)

: Biswarup Pathak (ResearcherID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 18 August 2020; Accepted 13 October 2020; Accepted Manuscript published 14 October 2020; Advance Article published 29 October 2020; Version of Record published 16 November 2020

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