Electrochemical gating enhances nearfield trapping of single metalloprotein junctions
Crossref DOI link: https://doi.org/10.1039/D1TC01535D
Published Online: 2021
Update policy: https://doi.org/10.1039/rsc_crossmark_policy
Aragonès, Albert C. https://orcid.org/0000-0002-1829-6941
Domke, Katrin F.
Funding for this research was provided by:
Boehringer Ingelheim Stiftung
H2020 Marie Skłodowska-Curie Actions (TECh-MoDE, #844668)
Version of Record valid from 2021-05-27
