Minimização dos efeitos de elementos parasitas em circuitos de Double Pulse Test para GaN HEMT
Crossref DOI link: https://doi.org/10.18618/REP.e202541
Published Online: 2025-07-16
Update policy: https://doi.org/10.18618/retraction
Ribeiro, Fabiano Mendes https://orcid.org/0009-0004-5997-6670
Heinrich, Rodrigo https://orcid.org/0009-0000-4479-9692
Novaes, Yales R. https://orcid.org/0000-0002-0958-6891
License valid from 2025-07-16
Publication History
Published Online: 2025-7-16
