SiC-Based Half-Bridge Converter: Impact of Gate Resistance on Switching Behavior and Loss Estimation
Crossref DOI link: https://doi.org/10.18618/REP.e202606
Published Online: 2026-01-19
Update policy: https://doi.org/10.18618/retraction
Evangelista Filho, João J. F.
Mayer, Robson https://orcid.org/0000-0002-2184-7679
Pomilio, José Antenor https://orcid.org/0000-0001-5457-4438
License valid from 2026-01-19
