Nanotube structures: material characterization and structural analysis of Ge–Se thin films
Crossref DOI link: https://doi.org/10.1007/s10854-018-0521-z
Published Online: 2018-12-11
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Latif, Muhammad R.
Tenne, Dmitri A.
Mitkova, Maria https://orcid.org/0000-0002-4129-0775
Funding for this research was provided by:
Idaho State Board of Education (IF 14-004)
Text and Data Mining valid from 2018-12-11
Article History
Received: 16 October 2018
Accepted: 5 December 2018
First Online: 11 December 2018
