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Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu

Crossref DOI link: https://doi.org/10.1016/j.actamat.2018.05.071

Published Print: 2018-08

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Jin, Miaomiao

Cao, Penghui https://orcid.org/0000-0001-9866-5075
Yip, Sidney

Short, Michael P. https://orcid.org/0000-0002-9216-2482
Funding

Funding for this research was provided by:

Idaho National Laboratory

Nuclear University Consortium

Laboratory Directed Research and Development (10-112583)

US Department of Energy (DOE) NEUP (DE-NE0008450)

National Science Foundation CAREER (DMR-1654548)
License Information

Text and Data Mining valid from 2018-08-01

Text and Data Mining valid from 2018-08-01

Accepted Manuscript valid from 2019-06-22
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This article is maintained by: Elsevier

Article Title: Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu

Journal Title: Acta Materialia

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.actamat.2018.05.071

Content Type: article

Copyright: © 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.