Fukami, Aya
Ghose, Saugata
Luo, Yixin
Cai, Yu
Mutlu, Onur
This article is maintained by: Elsevier
Article Title: Improving the reliability of chip-off forensic analysis of NAND flash memory devices
Journal Title: Digital Investigation
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.diin.2017.01.011
Content Type: article
Copyright: © 2017 The Author(s). Published by Elsevier Ltd on behalf of DFRWS.