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Comparison of the AlN and GaN crystalline quality on 2-inch silicon substrate via two growth methods

Crossref DOI link: https://doi.org/10.1016/j.jcrysgro.2020.125545

Published Print: 2020-04

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Li, Yangfeng https://orcid.org/0000-0001-9896-9116
Tang, Chak Wah

Lau, Kei May
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This article is maintained by: Elsevier

Article Title: Comparison of the AlN and GaN crystalline quality on 2-inch silicon substrate via two growth methods

Journal Title: Journal of Crystal Growth

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.jcrysgro.2020.125545

Content Type: article

Copyright: © 2020 Elsevier B.V. All rights reserved.