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ASAP7: A 7-nm finFET predictive process design kit

Crossref DOI link: https://doi.org/10.1016/j.mejo.2016.04.006

Published Print: 2016-07

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Clark, Lawrence T.

Vashishtha, Vinay

Shifren, Lucian

Gujja, Aditya

Sinha, Saurabh

Cline, Brian

Ramamurthy, Chandarasekaran

Yeric, Greg
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Text and Data Mining valid from 2016-07-01

Text and Data Mining valid from 2016-07-01

Version of Record valid from 2016-04-20
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This article is maintained by: Elsevier

Article Title: ASAP7: A 7-nm finFET predictive process design kit

Journal Title: Microelectronics Journal

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.mejo.2016.04.006

Content Type: article

Copyright: © 2016 The Authors. Published by Elsevier Ltd.