Ker, Ming-Dou
Lin, Wan-Yen
Yen, Cheng-Cheng
Funding for this research was provided by:
Ministry of Education
National Science Council (101-3113-P-110-004, NSC 102-2220-E-009-004)
National Chiao Tung University
This article is maintained by: Elsevier
Article Title: SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance
Journal Title: Microelectronics Reliability
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2013.08.010
Content Type: article
Copyright: Copyright © 2013 Elsevier Ltd. All rights reserved.