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Tunnel FET technology: A reliability perspective

Crossref DOI link: https://doi.org/10.1016/j.microrel.2014.02.002

Published Print: 2014-05

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Authors

Datta, Suman

Liu, Huichu

Narayanan, Vijaykrishnan
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This article is maintained by: Elsevier

Article Title: Tunnel FET technology: A reliability perspective

Journal Title: Microelectronics Reliability

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2014.02.002

Content Type: article

Copyright: Copyright © 2014 Published by Elsevier Ltd.