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Robust FinFET SRAM design based on dynamic back-gate voltage adjustment

Crossref DOI link: https://doi.org/10.1016/j.microrel.2014.04.015

Published Print: 2014-11

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Ebrahimi, Behzad

Afzali-Kusha, Ali

Mahmoodi, Hamid
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This article is maintained by: Elsevier

Article Title: Robust FinFET SRAM design based on dynamic back-gate voltage adjustment

Journal Title: Microelectronics Reliability

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2014.04.015

Content Type: article

Copyright: Copyright © 2014 Elsevier Ltd. All rights reserved.