Kuttappa, Ragh
Homayoun, Houman
Salmani, Hassan
Mahmoodi, Hamid
Funding for this research was provided by:
Defense Advanced Research Projects Agency (DARPA-AirForce, FA8650-15-C-7569)
This article is maintained by: Elsevier
Article Title: Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging
Journal Title: Microelectronics Reliability
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2016.03.003
Content Type: article
Copyright: © 2016 Elsevier Ltd. All rights reserved.