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Macro modeling of ion sensitive field effect transistor with current drift

Crossref DOI link: https://doi.org/10.1016/j.snb.2017.03.110

Published Print: 2017-10

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Kwon, Dae Woong

Kim, Sihyun

Lee, Ryoongbin

Mo, Hyun-Sun

Kim, Dae Hwan

Park, Byung-Gook
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This article is maintained by: Elsevier

Article Title: Macro modeling of ion sensitive field effect transistor with current drift

Journal Title: Sensors and Actuators B: Chemical

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.snb.2017.03.110

Content Type: article

Copyright: © 2017 Elsevier B.V. All rights reserved.