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Characterization of charge trapping phenomena at III–N/dielectric interfaces

Crossref DOI link: https://doi.org/10.1016/j.sse.2016.07.017

Published Print: 2016-11

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Stradiotto, Roberta

Pobegen, Gregor

Ostermaier, Clemens

Grasser, Tibor
Funding

Funding for this research was provided by:

Austrian Research Promotion Agency (846579)

Carinthian Economic Promotion Fund (1521|26876|38867)
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This article is maintained by: Elsevier

Article Title: Characterization of charge trapping phenomena at III–N/dielectric interfaces

Journal Title: Solid-State Electronics

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.sse.2016.07.017

Content Type: article

Copyright: © 2016 Elsevier Ltd. All rights reserved.