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Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part I: Theory and methodology

Crossref DOI link: https://doi.org/10.1016/j.sse.2016.10.012

Published Print: 2017-02

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Boudier, D.

Cretu, B.

Simoen, E.

Carin, R.

Veloso, A.

Collaert, N.

Thean, A.
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Article Title: Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part I: Theory and methodology

Journal Title: Solid-State Electronics

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.sse.2016.10.012

Content Type: article

Copyright: © 2016 Elsevier Ltd. All rights reserved.