Maniscalco, B.
Kaminski, P.M.
Walls, J.M.
Funding for this research was provided by:
EPSRC
TSB
This article is maintained by: Elsevier
Article Title: Thin film thickness measurements using Scanning White Light Interferometry
Journal Title: Thin Solid Films
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.tsf.2013.10.005
Content Type: article
Copyright: Copyright © 2013 Elsevier B.V.