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Determining the thickness of atomically thin MoS2 and WS2 in the TEM

Crossref DOI link: https://doi.org/10.1016/j.ultramic.2014.05.007

Published Print: 2014-12

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Wu, Ryan J.

Odlyzko, Michael L.

Mkhoyan, K. Andre
Funding

Funding for this research was provided by:

C-SPIN, one of the six centers of STARnet, a Semiconductor Research Corporation

MARCO and DARPA

the NSF (DMR-1006706)

the University of Minnesota Graduate School Fellowship
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This article is maintained by: Elsevier

Article Title: Determining the thickness of atomically thin MoS2 and WS2 in the TEM

Journal Title: Ultramicroscopy

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.ultramic.2014.05.007

Content Type: article

Copyright: Copyright © 2014 Elsevier B.V. All rights reserved.