Zhang, Yu
Kong, Charlie
Davidsen, Rasmus Schmidt
Scardera, Giuseppe
Duan, Leiping
Khoo, Kean Thong
Payne, David N.R.
Hoex, Bram
Abbott, Malcolm
Funding for this research was provided by:
Velux Fonden
Australian Renewable Energy Agency
This article is maintained by: Elsevier
Article Title: 3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon
Journal Title: Ultramicroscopy
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.ultramic.2020.113084
Content Type: article
Copyright: © 2020 Elsevier B.V. All rights reserved.