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Simultaneously measuring thickness, density, velocity and attenuation of thin layers using V(z,t) data from time-resolved acoustic microscopy

Crossref DOI link: https://doi.org/10.1016/j.ultras.2014.09.019

Published Print: 2015-02

Update policy: https://doi.org/10.1016/elsevier_cm_policy

Authors

Chen, Jian

Bai, Xiaolong

Yang, Keji

Ju, Bing-Feng
Funding

Funding for this research was provided by:

National Natural Science Foundation of China project (51175465)

Science Fund for Creative Research Groups of National Natural Science Foundation of China (51221004)

National Basic Research Program of China (2011CB706505)

Zhejiang Provincial Natural Science Foundation of China (Z1110393 and LZ13E050001)

Specialized Research Fund for the Doctoral Program of Higher Education (20120101110059)

Fundamental Research Funds for the Central Universities (2014FZA5002)

China Postdoctoral Science Foundation (2014M551729)
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This article is maintained by: Elsevier

Article Title: Simultaneously measuring thickness, density, velocity and attenuation of thin layers using V(z,t) data from time-resolved acoustic microscopy

Journal Title: Ultrasonics

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.ultras.2014.09.019

Content Type: article

Copyright: Copyright © 2014 Elsevier B.V. All rights reserved.