Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging
Crossref DOI link: https://doi.org/10.1073/pnas.1414106111
Published Online: 2014-11-17
Published Print: 2014-12-02
Update policy: https://doi.org/10.1073/pnas.cm10313
Boulanger, Jérôme
Gueudry, Charles
Münch, Daniel
Cinquin, Bertrand
Paul-Gilloteaux, Perrine
Bardin, Sabine
Guérin, Christophe
Senger, Fabrice
Blanchoin, Laurent
Salamero, Jean
Publication History
Published: 2014-11-17
