Uncovering edge states and electrical inhomogeneity in MoS <sub>2</sub> field-effect transistors
Crossref DOI link: https://doi.org/10.1073/pnas.1605982113
Published Online: 2016-07-21
Published Print: 2016-08-02
Update policy: https://doi.org/10.1073/pnas.cm10313
Wu, Di https://orcid.org/0000-0001-9924-4838
Li, Xiao
Luan, Lan
Wu, Xiaoyu
Li, Wei
Yogeesh, Maruthi N.
Ghosh, Rudresh
Chu, Zhaodong
Akinwande, Deji
Niu, Qian
Lai, Keji
Publication History
Published: 2016-07-21
