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Thickness scaling of ferroelectricity in BiFeO <sub>3</sub> by tomographic atomic force microscopy

Crossref DOI link: https://doi.org/10.1073/pnas.1806074116

Published Online: 2019-01-25

Published Print: 2019-02-12

Update policy: https://doi.org/10.1073/pnas.cm10313

Authors

Steffes, James J. https://orcid.org/0000-0002-7891-2582
Ristau, Roger A.

Ramesh, Ramamoorthy

Huey, Bryan D. https://orcid.org/0000-0002-1441-1180
Funding

Funding for this research was provided by:

NSF:MRI:Development (1726862)

UConn/Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (3136)
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Publication History

Published: 2019-01-25